ELEC 284 - Characterization, Testing of Nanotechnology Structures and Materials

3 credits (2 lecture, 2 lab)
This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance. Characterization includes electrical, optical, physical, and chemical approaches. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), fluorescence microscopes, and fourier transform infrared spectroscopy.
Corerequisite(s): ELEC 283
Prerequisite(s): ELEC 274, ELEC 282